ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,549,461, issued on Feb. 10, was assigned to InterDigital Patent Holdings Inc. (Wilmington, Del.). "Method and apparatus for real-time QoS monit... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,523, issued on Feb. 10, was assigned to Kassbohrer Gelandefahrzeug AG (Laupheim, Germany). "System and method for maintaining a snow piste"... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,549,508, issued on Feb. 10, was assigned to T-Mobile USA Inc. (Bellevue, Wash.). "Increase capacity of a wireless telecommunication network" wa... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,548,447, issued on Feb. 10, was assigned to DENSO Corp. (Kariya, Japan). "Risk prediction determination device and risk prediction determinatio... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,547,112, issued on Feb. 10, was assigned to Canon K.K. (Tokyo). "Image forming apparatus that forms antibacterial region on recording material"... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,299, issued on Feb. 10, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Liquid delivery pump" was invented by Nobuhiro Tsukada (Tokyo), D... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,547,344, issued on Feb. 10, was assigned to Micron Technology Inc. (Boise, Idaho). "Corrective read of a memory device with reduced latency" wa... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,549,138, issued on Feb. 10, was assigned to Qorvo US Inc. (Greensboro, N.C.). "Bandwidth adaptation in a transmission circuit" was invented by ... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,550,148, issued on Feb. 10, was assigned to QUALCOMM Inc. (San Diego). "Apparatus and method for scheduling delayed ACKs/NACKs in LTE cellular ... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,820, issued on Feb. 10, was assigned to SK hynix Inc. (Gyeonggi-do, South Korea). "Test mode control circuit, semiconductor apparatus and s... Read More